DocumentCode
1062701
Title
CEDA Currents
Volume
25
Issue
1
fYear
2008
Firstpage
100
Lastpage
101
Abstract
This newsletter covers news, research, and events related to the IEEE Council on Electronic Design Automation.
Keywords
Automatic testing; Conferences; Design automation; Design optimization; Electronic equipment testing; Europe; Joining IEEE; Network-on-a-chip; Timing; Very large scale integration; CEDA; DATE; EDA research; NoCS; PATMOS; SRC GRC; VLSI-SOC; industry growth;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.2008.4
Filename
4447918
Link To Document