DocumentCode
1062751
Title
Selecting Test Frequencies for Two-Tone Phase-Plane Analysis of ADCs: Part II
Author
Blair, Jerome J.
Author_Institution
Nat. Security Technol., Las Vegas
Volume
56
Issue
4
fYear
2007
Firstpage
1171
Lastpage
1175
Abstract
A method for selecting test frequencies for two-tone phase-plane modeling of ADCs is given. The results here include and generalize the results of a previous paper on the subject. The new results show how to select a good frequency pair that is near any two specified frequencies. An error analysis is given showing how close the actual test frequencies must be to their ideal values to maintain near-optimal phase-plane coverage.
Keywords
analogue-digital conversion; circuit testing; ADC; analog-to-digital converter; near-optimal phase-plane coverage; test frequencies; two-tone phase-plane analysis; Analog-digital conversion; Character recognition; Circuit testing; Error analysis; Frequency; National security; Phase distortion; Sampling methods; Signal analysis; Signal generators; Analog-to-digital converter (ADC) testing; distortion compensation; phase plane; two-tone tests;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/TIM.2007.899910
Filename
4277004
Link To Document