Title :
Influence of an external resistor on second breakdowns in epitaxial planar transistors
Author :
Hane, Kunio ; Mogi, Makoto ; Suzuki, Tokio
Author_Institution :
Keio University, Yokohama, Japan
fDate :
2/1/1979 12:00:00 AM
Abstract :
The boundary condition between current mode and thermal mode second breakdowns is analyzed theoretically considering the influence of the external resistor. Also the triggering energy and distribution of temperature along collector n-layer for thermal mode second breakdown is discussed.
Keywords :
Boundary conditions; Delay effects; Difference equations; Electric breakdown; Epitaxial layers; Impurities; Poisson equations; Resistors; Temperature; Voltage;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1979.19395
