• DocumentCode
    1062845
  • Title

    Quantum Transport Simulation of Silicon-Nanowire Transistors Based on Direct Solution Approach of the Wigner Transport Equation

  • Author

    Yamada, Yoshihiro ; Tsuchiya, Hideaki ; Ogawa, Matsuto

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Kobe Univ., Kobe
  • Volume
    56
  • Issue
    7
  • fYear
    2009
  • fDate
    7/1/2009 12:00:00 AM
  • Firstpage
    1396
  • Lastpage
    1401
  • Abstract
    In this paper, we present a self-consistent and 3D quantum simulator for Si-nanowire transistors based on the Wigner function model and multidimensional Schrodinger-Poisson algorithm. To achieve a sufficient numerical accuracy for calculating subthreshold current, we introduced a third-order differencing scheme for discretizing the drift term in the Wigner transport equation. By comparing with semiclassical Boltzmann and nonequilibrium Green´s function approaches, the validity of the present simulator is confirmed. We also demonstrate that the source-drain tunneling is a critical physical phenomenon related to a scaling limit of nanowire devices, and the semiclassical simulation measurably underestimates a minimum gate length.
  • Keywords
    Boltzmann equation; Green´s function methods; Poisson equation; Schrodinger equation; elemental semiconductors; nanoelectronics; nanowires; silicon; transistors; tunnelling; 3D quantum simulator; Si; Wigner transport equation; multidimensional Schrodinger-Poisson algorithm; nonequilibrium Green´s function approach; semiclassical Boltzmann approach; silicon-nanowire transistor; source-drain tunneling; Computational modeling; Difference equations; MOSFETs; Multidimensional systems; Nanoscale devices; Poisson equations; Potential well; Quantum computing; Schrodinger equation; Tunneling; Boltzmann transport equation; Wigner transport equation; gate-all-around (GAA) configuration; nonequilibrium Green´s function (NEGF) method; quantum confinement; silicon-nanowire transistors (SNWTs); source–drain (S-D) tunneling; subthreshold swing (SS);
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2009.2021355
  • Filename
    5067374