DocumentCode :
1062894
Title :
Observation and Study of Low-Frequency Oscillations in a 1.5-MW 110-GHz Gyrotron
Author :
Cerfon, Antoine J. ; Choi, Eunmi ; Marchewka, Chad D. ; Mastovsky, Ivan ; Shapiro, Michael A. ; Sirigiri, Jagadishwar R. ; Temkin, Richard J.
Author_Institution :
Plasma Sci. & Fusion Center, Massachusetts Inst. of Technol., Cambridge, MA
Volume :
37
Issue :
7
fYear :
2009
fDate :
7/1/2009 12:00:00 AM
Firstpage :
1219
Lastpage :
1224
Abstract :
We report the observation of low-frequency oscillations (LFOs) in the range 165-180 MHz in a 1.5-MW 110-GHz gyrotron operating in 3-mus pulses. The oscillations have been measured by a capacitive probe located just before the entrance to the cavity. The LFOs are observed only in a narrow region of beam parameter space, at voltages between 45 and 60 kV, where no microwave emission occurs. When the gyrotron operates near 96 kV, with high output power, they are not seen. The variation of the frequency of the oscillations with electron beam voltage and magnetic compression was measured, and the results are reported. Time-domain analysis of the probe signal shows the influence of the beam current and cathode voltage on the time of onset of the oscillations. The amplitude of the time-domain signal indicates that the trapped electron current associated with the LFOs represents a few percent of the total electron current.
Keywords :
electron traps; gyrotrons; plasma devices; plasma oscillations; plasma radiofrequency heating; time-domain analysis; beam parameter space; capacitive probe; cavity; frequency 110 GHz; frequency 165 MHz to 180 MHz; low-frequency oscillations; magnetic compression; power 1.5 MW; time 3 mus; time-domain analysis; trapped electron current; voltage 45 kV to 60 kV; Fusion; gyrotron; high-power microwave source; low-frequency oscillations (LFOs); trapped electrons;
fLanguage :
English
Journal_Title :
Plasma Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-3813
Type :
jour
DOI :
10.1109/TPS.2009.2020903
Filename :
5067379
Link To Document :
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