The crystallography and texture of Co-based thin film deposited on Cr underlayers

Author

Laughlin, David E. ; Wong, Bunsen Y.

Author_Institution

Dept. of Metall. Eng. & Mater. Sci., Carnegie Mellon Univ., Pittsburgh, PA, USA

Volume

27

Issue

6

fYear

1991

fDate

11/1/1991 12:00:00 AM

Firstpage

4713

Lastpage

4717

Abstract

Some of the evidence for the effect of Cr orientation on the crystallographic orientation of Co-based thin films is presented. The authors review four experimental techniques that can be used to investigate the orientation relationships (OR) between the magnetic Co-based film and the Cr underlayer. These techniques are X-ray diffraction, selected area (electron) diffraction (SAD), electron microdiffraction, and atomic resolution electron microscopy of cross sections of the bi-layer films. The authors focus on the crystallographic orientation relationships between the grains in the magnetic film and those in the Cr (BCC) underlayer. The magnetic films discussed are all alloys of Co, usually with HCP structure

Keywords

X-ray diffraction examination of materials; chromium alloys; cobalt alloys; crystal orientation; electron diffraction examination of materials; electron microscope examination of materials; ferromagnetic properties of substances; magnetic recording; magnetic thin films; nickel alloys; surface texture; BCC underlayer; CoNiCr-Cr; Cr orientation; Cr underlayers; HCP structure; X-ray diffraction; atomic resolution electron microscopy; bilayer films; crystallographic orientation; electron microdiffraction; hard disk; magnetic film; magnetic recording; selected area electron diffraction; texture; Chromium alloys; Cobalt alloys; Crystallography; Electrons; Magnetic films; Magnetic recording; Materials science and technology; Sputtering; Transistors; X-ray diffraction;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.278924

Filename

278924