Investigation of CoNiCr thin films deposited on [100] and [110] Cr single crystals

Author

Wong, B.Y. ; Laughlin, D.E. ; Lambeth, D.N.

Author_Institution

Carnegie Mellon Univ., Pittsburgh, PA, USA

Volume

27

Issue

6

fYear

1991

fDate

11/1/1991 12:00:00 AM

Firstpage

4733

Lastpage

4735

Abstract

Co_62.5 Ni₃₀Cr_7.5 thin films were sputtered onto [100] and [110] Cr single crystals as well as polycrystalline Cr transmission electron microscopy (TEM) foils. Vibrating sample magnetometer (VSM) measurements have revealed the existence of an anisotropy in the in-plane coercivity. This stems from the development of a crystallographic texture in the plane of the film. TEM investigations have found the presence of crystallographic variants in the direction of the HCP c-axis in the CoNiCr films deposited on (100) and (110) Cr surfaces. Lorentz microscopy studies have found specific crystallographic directions. The direction of magnetization within each domain is along the c-axis

Keywords

chromium alloys; cobalt alloys; coercive force; ferromagnetic properties of substances; magnetic anisotropy; magnetic domains; magnetic recording; magnetic thin films; magnetisation; nickel alloys; sputtered coatings; surface texture; transmission electron microscope examination of materials; (100) surface; (110) surface; Cr single crystal; Lorentz microscopy; TEM foils; VSM; anisotropy; crystallographic texture; in-plane coercivity; magnetic domain; magnetic recording media; magnetization; sputtered films; transmission electron microscopy; vibrating sample magnetometer; Anisotropic magnetoresistance; Chromium; Coercive force; Crystallography; Crystals; Magnetization; Magnetometers; Sputtering; Transmission electron microscopy; Vibration measurement;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.278930

Filename

278930