DocumentCode
1063087
Title
Background Limited Performance of Long Wavelength Infrared Focal Plane Arrays Fabricated From M-Structure InAs–GaSb Superlattices
Author
Delaunay, Pierre-Yves ; Nguyen, Binh Minh ; Hoffman, Darin ; Huang, Edward Kwei-wei ; Razeghi, Manijeh
Author_Institution
Dept. of Electr. Eng. & Comput. Sci., Northwestern Univ., Evanston, IL
Volume
45
Issue
2
fYear
2009
Firstpage
157
Lastpage
162
Abstract
The recent introduction of a M-structure design improved both the dark current and R0 A performances of type-II InAs-GaSb photodiodes. A focal plane array fabricated with this design was characterized at 81 K. The dark current of individual pixels was measured between 1.1 and 1.6 nA, 7 times lower than previous superlattice FPAs. This led to a higher dynamic range and longer integration times. The quantum efficiency of detectors without antireflective coating was 74%. The noise equivalent temperature difference reached 23 mK, limited only by the performance of the testing system and the read out integrated circuit. Background limited performances were demonstrated at 81 K for a 300 K background.
Keywords
III-V semiconductors; focal planes; gallium compounds; indium compounds; optical design techniques; optical fabrication; photodiodes; readout electronics; semiconductor superlattices; FPA fabrication; InAs-GaSb; M-structure design; M-structure superlattices; background limited performance; current 1.1 nA to 1.6 nA; dark current; long wavelength infrared focal plane arrays; quantum efficiency; read out integrated circuit; temperature 300 K; temperature 81 K; type-II photodiodes; Circuit testing; Coatings; Current measurement; Dark current; Detectors; Dynamic range; Integrated circuit noise; Photodiodes; Superlattices; Temperature; Focal plane array; infrared; photodetectors; type II superlattice;
fLanguage
English
Journal_Title
Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
0018-9197
Type
jour
DOI
10.1109/JQE.2008.2002667
Filename
4745940
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