Title :
The detector control unit: an ASIC for the monitoring of the CMS silicon tracker
Author :
MagazzÙ, G. ; Marchioro, A. ; Moreira, P.
Author_Institution :
CERN, Geneva, Switzerland
Abstract :
The detector control unit (DCU) is an ASIC developed as the central building block of a monitoring system for the Tracker of the Compact Muon Solenoid (CMS) experiment. Leakage currents in the Silicon detectors, power supply voltages of the readout electronics and local temperatures will be monitored in order to guarantee safe operating conditions during the 10-years lifetime in the large hadron collider (LHC) environment. All these measurements can be performed by an A/D converter preceded by an analog multiplexer and properly interfaced to the central control system. The requirements in terms of radiation tolerance, low-power dissipation and integration with the rest of the system led to the design of a custom integrated circuit. Its structure and characteristics are described in this paper.
Keywords :
CMOS integrated circuits; analogue-digital conversion; application specific integrated circuits; high energy physics instrumentation computing; leakage currents; multiplexing equipment; nuclear electronics; position sensitive particle detectors; readout electronics; silicon radiation detectors; temperature sensors; A/D converter; ASIC; CMOS integrated circuits; CMS silicon tracker monitoring; Compact Muon Solenoid experiment; LHC; Large Hadron Collider environment; VLSI device; analog multiplexer; central control system; custom integrated circuit; detector control unit; high energy physics experiment; leakage current; local temperature monitoring; low power dissipation; power supply voltage; rad hard technologies; radiation tolerance; readout electronics; safe operating condition; silicon detector; temperature sensor; Application specific integrated circuits; Centralized control; Collision mitigation; Control systems; Detectors; Large Hadron Collider; Mesons; Monitoring; Silicon; Solenoids;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2004.832925