DocumentCode :
1063205
Title :
FE-I2: a front-end readout chip designed in a commercial 0.25-μm process for the ATLAS pixel detector at LHC
Author :
Blanquart, L. ; Richardson, J. ; Einsweiler, K. ; Fischer, P. ; Mandelli, E. ; Meddeler, G. ; Peric, I.
Author_Institution :
Lawrence Berkeley Nat. Lab., CA, USA
Volume :
51
Issue :
4
fYear :
2004
Firstpage :
1358
Lastpage :
1364
Abstract :
A new front-end chip (FE-I2) has been developed for the ATLAS pixel detector at the future Large Hadron Collider (LHC) accelerator facility of the European Laboratory for Particle Physics (CERN). This chip has been submitted in a commercial 0.25-μm CMOS process using special layout techniques for radiation tolerance. It comprises 2880 pixels arranged into 18 columns of 160 channels. Each pixel element of dimension 50 μm × 400 μm is composed of a charge- sensitive amplifier followed by a fast discriminator with a detection threshold adjustable within a range of 0-6000 electrons and slow control logic incorporating a wired-hit-Or, preamplifier-kill, readout mask, and automatic threshold tuning circuitry. There are two single-event-upset (SEU)-tolerant DACs for reducing threshold (7-b) and recovery-time (3-b) mismatches from pixel to pixel along with digital hit emulation and a differential readout circuit aimed at transporting time-stamped data from each pixel to buffers at the bottom of the chip. In comparison to previous generations of the ATLAS pixel chip, FE-I2 incorporates many new features such as embedded "smart" decoupling capacitances, long-term overvoltage protection, linear regulators, a capacitance calibration charge-pump circuit, a power-on reset, and a leakage current monitoring circuit. Its predecessor (FE-I1) has been demonstrated to operate correctly after ionizing radiation doses exceeding 50 Mrad (SiO2). Special techniques employed for digital pick-up reduction are also described.
Keywords :
high energy physics instrumentation computing; leakage currents; nuclear electronics; position sensitive particle detectors; readout electronics; silicon radiation detectors; ATLAS pixel detector; CERN; CMOS process; FE-I1; FE-I2 front-end readout chip; LHC; Large Hadron Collider accelerator facility; active bias distribution; automatic threshold tuning circuitry; buffers; capacitance calibration charge-pump circuit; charge-sensitive amplifier; detection threshold; differential readout circuit; digital hit emulation; digital pick-up reduction; embedded smart decoupling capacitances; fast discriminator; hybrid pixel sensor; ionizing radiation dose; leakage current compensation; leakage current monitoring circuit; linear regulator; long term overvoltage protection; multichip module; pixel element dimension; power-on reset; preamplifier-kill; radiation tolerance; readout mask; recovery-time; shielding technique; single-event-upset-tolerant DAC; slow control logic; threshold adjustment; time-over-threshold; time-stamped data; wired-hit-Or; Automatic control; Automatic logic units; CMOS process; Capacitance; Circuits; Detectors; Electrons; Laboratories; Large Hadron Collider; Particle accelerators;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2004.832895
Filename :
1323697
Link To Document :
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