• DocumentCode
    1063508
  • Title

    In situ measurement of internal stress distribution in Fe/Al multi-layered films during formation

  • Author

    Kubota, K. ; Naoe, M.

  • Author_Institution
    Dept. of Phys. Electron., Tokyo Inst. of Technol., Japan
  • Volume
    27
  • Issue
    6
  • fYear
    1991
  • fDate
    11/1/1991 12:00:00 AM
  • Firstpage
    4867
  • Lastpage
    4869
  • Abstract
    In situ measurement of internal stress distribution in Fe/Al multilayered films was made by detecting the curvature of substrates during deposition. When the Al layer was deposited on the Fe layer, a large curvature of the substrate corresponding to the compressive stress in the films was detected. On the other hand, tensile stress appeared when the Fe layer was deposited on the Al layer, and the internal stress became compressive stress after the thickness of Fe layer exceed 10 Å. Mica sheets with thickness of 0.02 mm and a He-Ne laser were used as substrates and light source, respectively, in order to detect the curvature of the substrates during deposition of the Fe/Al multilayered films
  • Keywords
    aluminium; ferromagnetic properties of substances; internal stresses; iron; magnetic thin films; sputter deposition; sputtered coatings; stress measurement; Fe-Al multilayers; Fe/Al multi-layered films; compressive stress; curvature of substrates; in situ measurement; internal stress distribution; magnetic thin films; sputter deposition; tensile stress; Argon; Compressive stress; Internal stresses; Ion beams; Ion sources; Iron; Magnetic films; Sputtering; Stress measurement; Substrates;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.278973
  • Filename
    278973