Title :
Self-Aligned Silicon Interposer Tiles and Silicon Bridges Using Positive Self-Alignment Structures and Rematable Mechanically Flexible Interconnects
Author :
Hyung Suk Yang ; Chaoqi Zhang ; Bakir, Muhannad S.
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
A novel large-scale silicon system platform is proposed and demonstrated. In this paper, three silicon interposer tiles are aligned and mounted on a printed wiring board (PWB), and two silicon bridges are aligned and mounted on top of the three interposer tiles; each silicon bridge spans two interposer tiles. Four positive self-alignment structures and four inverted pyramid pits self-align a tile to the PWB and a bridge to two tiles. Mechanically flexible interconnects (MFI) form nonbonding electrical connections between the three interposer tiles and two silicon bridges; MFIs are fabricated on the interposer tiles. Pointy tips on the MFIs form low contact resistance with the pads on the silicon bridges. Less than 4 μm alignment error is demonstrated on a stack of silicon substrates, and <;8μm alignment error between a silicon bridge and tiles is also demonstrated on a FR4 substrate. Daisy chain and four-point measurements are performed to verify electrical connections between the three interposer tiles via MFIs and silicon bridges.
Keywords :
contact resistance; electric connectors; elemental semiconductors; integrated circuit interconnections; printed circuits; silicon; FR4 substrate; MFI; PWB; Si; contact resistance; daisy chain; four-point measurements; inverted pyramid pits; large-scale silicon system platform; nonbonding electrical connections; positive self-alignment structures; printed wiring board; rematable mechanically flexible interconnects; self-aligned silicon interposer tiles; silicon bridges; silicon substrates; Accuracy; Bridge circuits; Microscopy; Resists; Shape; Silicon; Substrates; Electronics packaging; integrated circuit interconnections; integrated circuit interconnections.;
Journal_Title :
Components, Packaging and Manufacturing Technology, IEEE Transactions on
DOI :
10.1109/TCPMT.2014.2357020