DocumentCode :
1063612
Title :
LAAPD low temperature performance in X-ray and visible-light detection
Author :
Fernandes, L.M.P. ; Lopes, J.A.M. ; Dos Santos, J.M.F. ; Knowles, P.E. ; Ludhova, L. ; Mulhauser, F. ; Kottmann, F. ; Pohl, R. ; Taqqu, D.
Author_Institution :
Phys. Dept., Univ. of Coimbra, Portugal
Volume :
51
Issue :
4
fYear :
2004
Firstpage :
1575
Lastpage :
1580
Abstract :
The performance of a large area avalanche photodiode (LAAPD) has been investigated for X-ray and visible-light detection as a function of temperature. Energy resolution improves significantly with decreasing temperature down to 0°C and, below that value, at a much slower rate, achieving 9.6% for 5.9 keV X-rays at 0°C and for a gain of 60. The gain drift with temperature increases with the reverse bias voltage and is almost constant for temperatures above -15°C, reaching rates higher than -5% per degrees Celsius, for a bias voltage of 1770 V. Similar results were obtained for X-ray and visible-light detection. LAAPD nonlinearity between X-ray and light gains is less than 2%, even for gains around 300, and decreases with temperature, being less than 0.5% at 0°C, for gains up to 200. For X-rays, the minimum detectable energy is about 0.7 keV at operation temperatures around 16°C, for gains above 100, decreasing to about 0.3 keV at temperatures less than 0°C, for gains above 200.
Keywords :
X-ray detection; avalanche photodiodes; gain measurement; scintillation counters; temperature; ultraviolet detectors; -15 C; 0 C; 16 C; LAAPD low temperature performance; LAAPD nonlinearity; VUV detection; X-ray detection; X-ray gains; bias voltage; energy resolution; gain drift; large area avalanche photodiode; light gains; minimum detectable energy; operation temperatures; reverse bias voltage; scintillation detection; visible-light detection; Charge measurement; Current measurement; Electrons; Energy resolution; P-n junctions; Physics; Temperature; Voltage; X-ray detection; X-ray detectors;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2004.832976
Filename :
1323733
Link To Document :
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