• DocumentCode
    1063629
  • Title

    Low-pressure chemical vapor deposition for very large-scale integration processing—A review

  • Author

    Kern, Werner ; Schnable, George L.

  • Author_Institution
    RCA Laboratories, Princeton, NJ
  • Volume
    26
  • Issue
    4
  • fYear
    1979
  • fDate
    4/1/1979 12:00:00 AM
  • Firstpage
    647
  • Lastpage
    657
  • Abstract
    An overview is presented of low-pressure chemical vapor deposition and its applicability to VLSI processing for depositing thin films of insulators, semiconductors, and metals. The major contributions of low-pressure chemical vapor deposition to VLSI technology are its capability for economically producing films with superior uniformity, high purity, and excellent step coverage-factors essential for achieving the very high device reliability and high product yield required in the manufacturing of VLSI devices. Specific examples from the recent literature are reviewed to exemplify how the technique has been utilized to date in solid-state device technology. Applications of films produced by low-pressure reactive plasma chemical vapor deposition are also included.
  • Keywords
    Chemical technology; Chemical vapor deposition; Insulation; Large scale integration; Metal-insulator structures; Semiconductor device manufacture; Semiconductor films; Semiconductor thin films; Sputtering; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1979.19473
  • Filename
    1480051