• DocumentCode
    1063733
  • Title

    An improved model for four-terminal junction field-effect transistors

  • Author

    Liou, J.J. ; Yue, Y.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Central Florida Univ., Orlando, FL, USA
  • Volume
    43
  • Issue
    8
  • fYear
    1996
  • fDate
    8/1/1996 12:00:00 AM
  • Firstpage
    1309
  • Lastpage
    1311
  • Abstract
    The junction field-effect transistor (JFET) has isolated top- and bottom-gate terminals and therefore is useful for signal mixing applications. Existing models for the four-terminal JFET often have the same form as the three-terminal JFET model, however, in which only a single pinch-off voltage is used to describe the current-voltage characteristics. In this paper, a more general four-terminal JFET model is developed. Two different pinch-off voltages are involved in the improved model to account more comprehensively for the effects of both depletion regions associated with the top- and bottom-gate junctions. Results simulated from a device simulator are also included in support of the model
  • Keywords
    junction gate field effect transistors; semiconductor device models; JFET; bottom-gate; current-voltage characteristics; depletion region; device simulation; four-terminal junction field-effect transistor; model; pinch-off voltage; signal mixing; top-gate; Current-voltage characteristics; Doping; FETs; Fluctuations; Merging; Noise reduction; Physics; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.506786
  • Filename
    506786