Title :
An improved model for four-terminal junction field-effect transistors
Author :
Liou, J.J. ; Yue, Y.
Author_Institution :
Dept. of Electr. & Comput. Eng., Central Florida Univ., Orlando, FL, USA
fDate :
8/1/1996 12:00:00 AM
Abstract :
The junction field-effect transistor (JFET) has isolated top- and bottom-gate terminals and therefore is useful for signal mixing applications. Existing models for the four-terminal JFET often have the same form as the three-terminal JFET model, however, in which only a single pinch-off voltage is used to describe the current-voltage characteristics. In this paper, a more general four-terminal JFET model is developed. Two different pinch-off voltages are involved in the improved model to account more comprehensively for the effects of both depletion regions associated with the top- and bottom-gate junctions. Results simulated from a device simulator are also included in support of the model
Keywords :
junction gate field effect transistors; semiconductor device models; JFET; bottom-gate; current-voltage characteristics; depletion region; device simulation; four-terminal junction field-effect transistor; model; pinch-off voltage; signal mixing; top-gate; Current-voltage characteristics; Doping; FETs; Fluctuations; Merging; Noise reduction; Physics; Voltage;
Journal_Title :
Electron Devices, IEEE Transactions on