DocumentCode :
1063733
Title :
An improved model for four-terminal junction field-effect transistors
Author :
Liou, J.J. ; Yue, Y.
Author_Institution :
Dept. of Electr. & Comput. Eng., Central Florida Univ., Orlando, FL, USA
Volume :
43
Issue :
8
fYear :
1996
fDate :
8/1/1996 12:00:00 AM
Firstpage :
1309
Lastpage :
1311
Abstract :
The junction field-effect transistor (JFET) has isolated top- and bottom-gate terminals and therefore is useful for signal mixing applications. Existing models for the four-terminal JFET often have the same form as the three-terminal JFET model, however, in which only a single pinch-off voltage is used to describe the current-voltage characteristics. In this paper, a more general four-terminal JFET model is developed. Two different pinch-off voltages are involved in the improved model to account more comprehensively for the effects of both depletion regions associated with the top- and bottom-gate junctions. Results simulated from a device simulator are also included in support of the model
Keywords :
junction gate field effect transistors; semiconductor device models; JFET; bottom-gate; current-voltage characteristics; depletion region; device simulation; four-terminal junction field-effect transistor; model; pinch-off voltage; signal mixing; top-gate; Current-voltage characteristics; Doping; FETs; Fluctuations; Merging; Noise reduction; Physics; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.506786
Filename :
506786
Link To Document :
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