• DocumentCode
    1063906
  • Title

    Fluctuations of the charge on a dust grain in a plasma

  • Author

    Cui, Chunshi ; Goree, J.

  • Author_Institution
    Dept. of Phys. & Astron., Iowa Univ., Iowa City, IA, USA
  • Volume
    22
  • Issue
    2
  • fYear
    1994
  • fDate
    4/1/1994 12:00:00 AM
  • Firstpage
    151
  • Lastpage
    158
  • Abstract
    A dust grain in a plasma acquires an electric charge by collecting electron and ion currents. These currents consist of discrete charges, causing the charge to fluctuate around an equilibrium value ⟨Q⟩. Electrons and ions are collected at random intervals and in a random sequence, with probabilities that depend on the grain´s potential. We developed a model for these probabilities and implemented it in a numerical simulation of the collection of individual ions and electrons, yielding a time series Q(t) for the grain´s charge. Electron emission from the grain is not included, although it could be added easily to our method. We obtained the power spectrum and the RMS fluctuation level, as well as the distribution function of the charge. Most of the power in the spectrum lies at frequencies much lower than 1/τ, the inverse charging time. The RMS fractional fluctuation level varies as 0.5 |⟨N⟩|-1/2, where ⟨N⟩=⟨Q⟩/e is the average number of electron charges on the grain. This inverse square-root scaling means that fluctuations are most important for small grains. We also show that very small grains can experience fluctuations to neutral and positive polarities, even in the absence of electron emission
  • Keywords
    astrophysical plasma; dust; electric charge; fluctuations; plasma collision processes; plasma impurities; RMS fluctuation level; RMS fractional fluctuation level; charge fluctuations; dust grain; electric charge; electron currents; equilibrium value; ion currents; plasma; power spectrum; time series; Charge carriers; Distribution functions; Dusty plasma; Electron emission; Fluctuations; Magnetic flux; Numerical simulation; Plasma properties; Plasma simulation; Surface charging;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/27.279018
  • Filename
    279018