Title :
A Speed-Enhancing Dual-Trial Instantaneous Switching Architecture for SAR ADCs
Author :
Lin He ; Jiaqi Yang ; Duona Luo ; Lele Jin ; Shuangshuang Zhang ; Fujiang Lin ; Libin Yao ; Xicheng Jiang
Author_Institution :
Micro-/Nano-Electron. Syst. Integration Center (MESIC), Univ. of Sci. & Technol. of China, Hefei, China
Abstract :
A single-channel asynchronous successive approximation register analog-to-digital converter with a dual-trial instantaneous switching scheme is presented in this brief. The proposed architecture uses two capacitive digital-to-analog converter (DAC) arrays to generate two possible outputs while the comparator is in the regeneration process. Two comparators are assigned to each DAC to alternately switch between the compare phase and the reset phase. Such an approach allows the overlapping of the DAC settling, the comparator reset, and the comparator regeneration, which significantly improves the conversion speed. Furthermore, the random nature of the internal channel selection converts the mismatches between both channels into wideband noise, which improves the spurious-free dynamic range.
Keywords :
analogue-digital conversion; comparators (circuits); digital-analogue conversion; DAC arrays; SAR ADC; analog-to-digital converter; capacitive digital-to-analog converter; comparator regeneration; comparator reset; internal channel selection; single-channel asynchronous successive approximation register; speed-enhancing dual-trial instantaneous switching architecture; wideband noise; Arrays; Circuits and systems; Diffusion tensor imaging; Noise; Registers; Switches; Timing; Analog-to-digital conversion (ADC); SAR ADC; analog-to-digital conversion; asynchronous; gain mismatch; high speed; high-speed; offset mismatch; successive approximation; successive approximation register (SAR) ADC; time interleaved (TI); time-interleaved;
Journal_Title :
Circuits and Systems II: Express Briefs, IEEE Transactions on
DOI :
10.1109/TCSII.2014.2362722