• DocumentCode
    1064141
  • Title

    3-D electronics interconnect for high-performance imaging detectors

  • Author

    Kwiatkowski, Kris ; Lyke, Jim ; Wojnarowski, Robert ; Kapusta, Chris ; Kleinfelder, Stuart ; Wilke, Mark

  • Author_Institution
    Phys. Div., Los Alamos Nat. Lab., NM, USA
  • Volume
    51
  • Issue
    4
  • fYear
    2004
  • Firstpage
    1829
  • Lastpage
    1834
  • Abstract
    We describe work that extends three-dimensional (3-D) patterned overlay high-density interconnect (HDI) to high-performance imaging applications. The work was motivated by the rigorous requirements of the multiple-pulse imager for dynamic proton radiography. The optical imager has to provide large (>90%) optical fill factor, high quantum efficiency, 200-ns inter-frame time interval, and storage for >32 frames. In order to accommodate the massively parallel electronics including the signal storage for a large number of frames, it is necessary to provide novel 3-D interconnect and packaging architectures. Recently, a 3-D interconnect technology was successfully demonstrated to assemble a stack of 50 signal-processing chips into a cube. Each chip contained test connections (interconnect continuity only) simulating 160 channels of pixel read-out electronics. Test cube assemblies, based on these mock-up integrated circuits, have been fabricated to explore the feasibility of constructing functional cube arrays. A novel 3-D integrated sensor-electronics (mirror-cube) imager architecture is proposed. We also briefly review progress in the custom fast image-processing electronics.
  • Keywords
    image processing; integrated circuits; nuclear electronics; parallel processing; position sensitive particle detectors; proton effects; radiography; readout electronics; reviews; 3-D electronics interconnect technology; 3-D integrated sensor-electronics imager architecture; 3-D patterned overlay high-density interconnect; HDI; adaptive lithography; die stacking; dynamic proton radiography; fast image-processing electronics; functional cube arrays; high quantum efficiency; high-performance imaging detector; interconnect continuity; interframe time interval; massively parallel electronics; mirror imaging cube; mock-up integrated circuits; multiple-pulse imager; optical fill factor; optical imager; packaging architecture; pixel read-out electronics; polymer bump bonding; review; signal storage; signal-processing chips; test cube assembly; Assembly; Circuit testing; Detectors; Electronic equipment testing; Image storage; Integrated circuit interconnections; Optical imaging; Optical interconnections; Optical sensors; Protons;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2004.832712
  • Filename
    1323776