DocumentCode
1064166
Title
Heavily doped transparent-emitter regions in junction solar cells, diodes, and transistors
Author
Shibib, Ayman M. ; Lindholm, Fredrik A. ; Therez, Francis
Author_Institution
University of Florida, Gainesville, FL
Volume
26
Issue
6
fYear
1979
fDate
6/1/1979 12:00:00 AM
Firstpage
959
Lastpage
965
Abstract
An analytical treatment of heavily doped transparentemitter devices is presented that includes the effects of bandgap narrowing, Fermi-Dirac statistics, a doping concentration gradient, and a finite surface recombination velocity S at the emitter surface. Transparency of the emitter to minority carrier is defined by the condition that the transit time τt is much smaller than the minority carrier lifetime in the emitter τp ,
. As part of the analytical treatment, a self-consistency test is formulated that checks the validity of the assumption of emitter transparency for any given device. The transparent-emitter model is applied to calculate the dependence of the open-circuit voltage VOC of n+-p junction silicon solar cells made on low-resistivity substrates. The calculated VOC agrees with experimental values for high
cm/s) provided the effects of bandgap narrowing (modified by Fermi-Dirac statistics) are included in the transparent-emitter model.
. As part of the analytical treatment, a self-consistency test is formulated that checks the validity of the assumption of emitter transparency for any given device. The transparent-emitter model is applied to calculate the dependence of the open-circuit voltage V
cm/s) provided the effects of bandgap narrowing (modified by Fermi-Dirac statistics) are included in the transparent-emitter model.Keywords
Automatic testing; Charge carrier lifetime; Diodes; Doping; Photonic band gap; Photovoltaic cells; Silicon; Statistical analysis; Surface treatment; Voltage;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1979.19525
Filename
1480103
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