• DocumentCode
    1064166
  • Title

    Heavily doped transparent-emitter regions in junction solar cells, diodes, and transistors

  • Author

    Shibib, Ayman M. ; Lindholm, Fredrik A. ; Therez, Francis

  • Author_Institution
    University of Florida, Gainesville, FL
  • Volume
    26
  • Issue
    6
  • fYear
    1979
  • fDate
    6/1/1979 12:00:00 AM
  • Firstpage
    959
  • Lastpage
    965
  • Abstract
    An analytical treatment of heavily doped transparentemitter devices is presented that includes the effects of bandgap narrowing, Fermi-Dirac statistics, a doping concentration gradient, and a finite surface recombination velocity S at the emitter surface. Transparency of the emitter to minority carrier is defined by the condition that the transit time τtis much smaller than the minority carrier lifetime in the emitter τp, \\tau _{t} \\ll \\tau _{p} . As part of the analytical treatment, a self-consistency test is formulated that checks the validity of the assumption of emitter transparency for any given device. The transparent-emitter model is applied to calculate the dependence of the open-circuit voltage VOCof n+-p junction silicon solar cells made on low-resistivity substrates. The calculated VOCagrees with experimental values for high S_{P}( \\geq 5 \\\\times 10^{4} cm/s) provided the effects of bandgap narrowing (modified by Fermi-Dirac statistics) are included in the transparent-emitter model.
  • Keywords
    Automatic testing; Charge carrier lifetime; Diodes; Doping; Photonic band gap; Photovoltaic cells; Silicon; Statistical analysis; Surface treatment; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1979.19525
  • Filename
    1480103