DocumentCode :
106422
Title :
Memristor: Part II–DC, Transient, and RF Analysis
Author :
Mazady, Anas ; Anwar, Mohd
Author_Institution :
Electr. & Comput. Eng. Dept., Univ. of Connecticut, Storrs, CT, USA
Volume :
61
Issue :
4
fYear :
2014
fDate :
Apr-14
Firstpage :
1062
Lastpage :
1070
Abstract :
The dc and RF circuit performance of memristor circuits, including transient behavior, is developed by considering current contributions arising from different conduction mechanisms, namely, filament-assisted and bulk tunneling currents and currents flowing through low and high conductivity filaments. The dc circuit model explains the observed I-V hysteresis and most importantly allows scaling and optimization. A transient circuit model of memristive system is developed, based upon the dynamics, incorporating underlying electrochemistry that suggests SET and RESET transitions for a 50-nm TiO2-based memristor take approximately 120 ps to stabilize. A faster READ/WRITE operation would require appropriate conditioning circuitry. RF analysis suggests for a maximum allowable frequency of 7.5 GHz beyond which memristors can no longer be used as RRAM. These values can be pushed to higher limits by increasing the device cross-sectional area or choosing lower permittivity materials. The developed model allows its incorporation in commercial circuit simulators. The derived model is validated by incorporating it in Chua´s chaotic circuit.
Keywords :
hysteresis; memristors; titanium compounds; transient analysis; Chua chaotic circuit; I-V hysteresis; READ-WRITE operation; RESET transitions; RF analysis; RF circuit performance; TiO2-based memristor; TiO2; bulk tunneling currents; commercial circuit simulators; conditioning circuitry; conduction mechanisms; dc circuit performance; electrochemistry; filament-assisted currents; high conductivity filaments; low conductivity filaments; memristive system; memristor circuits; transient behavior; transient circuit model; Conductivity; Equations; Integrated circuit modeling; Mathematical model; Memristors; Transient analysis; Tunneling; Dynamics; RF; high frequency response; memristor; transient;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2014.2304639
Filename :
6744571
Link To Document :
بازگشت