• DocumentCode
    1064339
  • Title

    Engineering strained silicon-looking back and into the future

  • Author

    Acosta, Tony ; Sood, Sumant

  • Volume
    25
  • Issue
    4
  • fYear
    2006
  • Firstpage
    31
  • Lastpage
    34
  • Abstract
    The purpose of this article is to explain the basics behind straining and report on the current process technologies available to strain CMOS devices. Strained Si enhances the performance of CMOS devices by increasing carrier mobility without having to make them smaller. As the benefits to be gained from scaling transistors continue to decrease, the commercial interest in using strained Si for CMOS devices has spiked. Additionally, strained Si still retains its integratability in CMOS manufacturing processes, unlike any other semiconductor material. Thus the real test for engineers lies in the ability to cost-effectively develop and apply strained Si technology into current CMOS process. Thus new methods for straining Si is integrated into IC manufacturing as industry interest in this technology continues to grow and also increases the speed, performance and functions of the circuits
  • Keywords
    CMOS integrated circuits; carrier mobility; elemental semiconductors; integrated circuit manufacture; silicon; carrier mobility; integrated circuit manufacturing; scaling transistor; semiconductor material; strain CMOS device; CMOS process; CMOS technology; Capacitive sensors; Circuit testing; Integrated circuit manufacture; Integrated circuit technology; Manufacturing industries; Manufacturing processes; Semiconductor device manufacture; Semiconductor materials;
  • fLanguage
    English
  • Journal_Title
    Potentials, IEEE
  • Publisher
    ieee
  • ISSN
    0278-6648
  • Type

    jour

  • DOI
    10.1109/MP.2006.1664067
  • Filename
    1664067