DocumentCode
1064339
Title
Engineering strained silicon-looking back and into the future
Author
Acosta, Tony ; Sood, Sumant
Volume
25
Issue
4
fYear
2006
Firstpage
31
Lastpage
34
Abstract
The purpose of this article is to explain the basics behind straining and report on the current process technologies available to strain CMOS devices. Strained Si enhances the performance of CMOS devices by increasing carrier mobility without having to make them smaller. As the benefits to be gained from scaling transistors continue to decrease, the commercial interest in using strained Si for CMOS devices has spiked. Additionally, strained Si still retains its integratability in CMOS manufacturing processes, unlike any other semiconductor material. Thus the real test for engineers lies in the ability to cost-effectively develop and apply strained Si technology into current CMOS process. Thus new methods for straining Si is integrated into IC manufacturing as industry interest in this technology continues to grow and also increases the speed, performance and functions of the circuits
Keywords
CMOS integrated circuits; carrier mobility; elemental semiconductors; integrated circuit manufacture; silicon; carrier mobility; integrated circuit manufacturing; scaling transistor; semiconductor material; strain CMOS device; CMOS process; CMOS technology; Capacitive sensors; Circuit testing; Integrated circuit manufacture; Integrated circuit technology; Manufacturing industries; Manufacturing processes; Semiconductor device manufacture; Semiconductor materials;
fLanguage
English
Journal_Title
Potentials, IEEE
Publisher
ieee
ISSN
0278-6648
Type
jour
DOI
10.1109/MP.2006.1664067
Filename
1664067
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