• DocumentCode
    1064397
  • Title

    CPM: a deformable model for shape recovery and segmentation based on charged particles

  • Author

    Jalba, Andrei C. ; Wilkinson, Michael H F ; Roerdink, Jos B T M

  • Author_Institution
    Dept. of Math. & Comput. Sci., Groningen Univ., Netherlands
  • Volume
    26
  • Issue
    10
  • fYear
    2004
  • Firstpage
    1320
  • Lastpage
    1335
  • Abstract
    A novel, physically motivated deformable model for shape recovery and segmentation is presented. The model, referred to as the charged-particle model (CPM), is inspired by classical electrodynamics and is based on a simulation of charged particles moving in an electrostatic field. The charges are attracted towards the contours of the objects of interest by an electrostatic field, whose sources are computed based on the gradient-magnitude image. The electric field plays the same role as the potential forces in the snake model, while internal interactions are modeled by repulsive Coulomb forces. We demonstrate the flexibility and potential of the model in a wide variety of settings: shape recovery using manual initialization, automatic segmentation, and skeleton computation. We perform a comparative analysis of the proposed model with the active contour model and show that specific problems of the latter are surmounted by our model. The model is easily extendable to 3D and copes well with noisy images.
  • Keywords
    electric fields; electrodynamics; image reconstruction; image segmentation; active contour model; charged-particle model; deformable model; electrodynamics; electrostatic field; gradient-magnitude image; image segmentation; noisy images; repulsive Coulomb forces; shape recovery; skeleton computation; snake model; Active contours; Computational modeling; Deformable models; Electrodynamics; Electrostatics; Image segmentation; Noise shaping; Performance analysis; Shape; Skeleton; Coulomb force; Index Terms- Deformable model; charged-particle system; electrostatic field; segmentation; shape recovery; skeleton.; Algorithms; Artificial Intelligence; Computer Simulation; Image Enhancement; Image Interpretation, Computer-Assisted; Imaging, Three-Dimensional; Information Storage and Retrieval; Models, Biological; Models, Statistical; Numerical Analysis, Computer-Assisted; Pattern Recognition, Automated; Reproducibility of Results; Sensitivity and Specificity; Signal Processing, Computer-Assisted; Stochastic Processes;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/TPAMI.2004.84
  • Filename
    1323800