DocumentCode
1064461
Title
Separating reflection components based on chromaticity and noise analysis
Author
Tan, Robby T. ; Nishino, Ko ; Ikeuchi, Katsushi
Author_Institution
Dept. of Comput. Sci., Tokyo Univ., Japan
Volume
26
Issue
10
fYear
2004
Firstpage
1373
Lastpage
1379
Abstract
Many algorithms in computer vision assume diffuse only reflections and deem specular reflections to be outliers. However, in the real world, the presence of specular reflections is inevitable since there are many dielectric inhomogeneous objects which have both diffuse and specular reflections. To resolve this problem, we present a method to separate the two reflection components. The method is principally based on the distribution of specular and diffuse points in a two-dimensional maximum chromaticity-intensity space. We found that, by utilizing the space and known illumination color, the problem of reflection component separation can be simplified into the problem of identifying diffuse maximum chromaticity. To be able to identity the diffuse maximum chromaticity correctly, an analysis of the noise is required since most real images suffer from it. Unlike existing methods, the proposed method can separate the reflection components robustly for any kind of surface roughness and light direction.
Keywords
image colour analysis; image denoising; light reflection; separation; chromaticity; dielectric inhomogeneous objects; noise analysis; reflection components separation; surface roughness; Acoustic reflection; Colored noise; Computer vision; Dielectrics; Image analysis; Lighting; Noise robustness; Optical reflection; Rough surfaces; Surface roughness; Index Terms- Reflection components separation; chromaticity; dichromatic reflection model; diffuse reflection; noise analysis; specular reflection; specular-to-diffuse mechanism.; Algorithms; Artificial Intelligence; Color; Colorimetry; Computer Graphics; Computer Simulation; Image Enhancement; Image Interpretation, Computer-Assisted; Imaging, Three-Dimensional; Information Storage and Retrieval; Light; Lighting; Models, Biological; Models, Statistical; Numerical Analysis, Computer-Assisted; Pattern Recognition, Automated; Reproducibility of Results; Sensitivity and Specificity; Signal Processing, Computer-Assisted; Stochastic Processes; Subtraction Technique;
fLanguage
English
Journal_Title
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher
ieee
ISSN
0162-8828
Type
jour
DOI
10.1109/TPAMI.2004.90
Filename
1323805
Link To Document