• DocumentCode
    1064461
  • Title

    Separating reflection components based on chromaticity and noise analysis

  • Author

    Tan, Robby T. ; Nishino, Ko ; Ikeuchi, Katsushi

  • Author_Institution
    Dept. of Comput. Sci., Tokyo Univ., Japan
  • Volume
    26
  • Issue
    10
  • fYear
    2004
  • Firstpage
    1373
  • Lastpage
    1379
  • Abstract
    Many algorithms in computer vision assume diffuse only reflections and deem specular reflections to be outliers. However, in the real world, the presence of specular reflections is inevitable since there are many dielectric inhomogeneous objects which have both diffuse and specular reflections. To resolve this problem, we present a method to separate the two reflection components. The method is principally based on the distribution of specular and diffuse points in a two-dimensional maximum chromaticity-intensity space. We found that, by utilizing the space and known illumination color, the problem of reflection component separation can be simplified into the problem of identifying diffuse maximum chromaticity. To be able to identity the diffuse maximum chromaticity correctly, an analysis of the noise is required since most real images suffer from it. Unlike existing methods, the proposed method can separate the reflection components robustly for any kind of surface roughness and light direction.
  • Keywords
    image colour analysis; image denoising; light reflection; separation; chromaticity; dielectric inhomogeneous objects; noise analysis; reflection components separation; surface roughness; Acoustic reflection; Colored noise; Computer vision; Dielectrics; Image analysis; Lighting; Noise robustness; Optical reflection; Rough surfaces; Surface roughness; Index Terms- Reflection components separation; chromaticity; dichromatic reflection model; diffuse reflection; noise analysis; specular reflection; specular-to-diffuse mechanism.; Algorithms; Artificial Intelligence; Color; Colorimetry; Computer Graphics; Computer Simulation; Image Enhancement; Image Interpretation, Computer-Assisted; Imaging, Three-Dimensional; Information Storage and Retrieval; Light; Lighting; Models, Biological; Models, Statistical; Numerical Analysis, Computer-Assisted; Pattern Recognition, Automated; Reproducibility of Results; Sensitivity and Specificity; Signal Processing, Computer-Assisted; Stochastic Processes; Subtraction Technique;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/TPAMI.2004.90
  • Filename
    1323805