• DocumentCode
    106473
  • Title

    Digital calibration technique using a signed counter for charge pump mismatch in phase-locked loops

  • Author

    Jeong, Cheol ; Kim, Kunsu ; Kwon, Chan-keun ; Kim, Heonhwan ; Kim, Sungho

  • Author_Institution
    Dept. of Nano Semicond. Eng., Korea Univ., Seoul, South Korea
  • Volume
    7
  • Issue
    6
  • fYear
    2013
  • fDate
    Nov-13
  • Firstpage
    313
  • Lastpage
    318
  • Abstract
    The authors adopt a digital technique to calibrate the current mismatch of the charge pump in phase-locked loops. The proposed digital calibration technique using a signed counter reduces the calibration time up to a minimum of 64% as compared with the other techniques. This technique is designed by a standard 0.18 μm CMOS technology. The calibration time is 32.8 μs, the average power is 6.2 mW at a 1.8 V power supply and the effective area is 0.263 mm2.
  • Keywords
    CMOS digital integrated circuits; calibration; charge pump circuits; digital phase locked loops; charge pump mismatch; digital calibration technique; phase-locked loops; power 6.2 mW; signed counter; size 0.18 mum; standard CMOS technology; time 32.8 mus; voltage 1.8 V;
  • fLanguage
    English
  • Journal_Title
    Circuits, Devices & Systems, IET
  • Publisher
    iet
  • ISSN
    1751-858X
  • Type

    jour

  • DOI
    10.1049/iet-cds.2013.0011
  • Filename
    6673843