DocumentCode :
1064836
Title :
Advanced devices and components for the millimeter and submillimeter systems
Author :
Calviello, Joseph A.
Author_Institution :
AIL Division of Cutler-Hammer, Melville, NY
Volume :
26
Issue :
9
fYear :
1979
fDate :
9/1/1979 12:00:00 AM
Firstpage :
1273
Lastpage :
1281
Abstract :
The purpose of this paper is to discuss key topics related to low-noise mixers, high efficiency multipliers, the use of quasi-optical techniques to reduce circuit losses, and the development of very high-Q devices applicable to the millimeter and submillimeter wavelengths [1]-[5]. In particular, we will describe the development of a highly reliable metalized GaAs Ta-Schottky-barrier diode with native-oxide passivation. The zero-bias cutoff frequency of these diodes is greater than 1000 GHz when measured accurately near 60 GHz with a zero-bias junction capacitance near 0.1 pF. This zero-bias cutoff frequency is approximately twice the value for a comparable nonmetallized device. Using these very high-Q devices, we have achieved RF performance that has advanced prior state of the art. In frequency multipliers, doublers (100-200 GHz), and triplers (100-300 GHz), we have realized conversion efficiencies of 12 and 2 percent, respectively. The CW output power of the doubler was 18 mW and that of the tripler 2 mW. In an image-enhanced mixer at 35 GHz with an IF of 1 GHz, we have realized conversion loss below 3 dB including 0.6-dB circuit losses, and less than 5.9-dB noise figure (SSB) including a 2-dB IF noise-figure contribution.
Keywords :
Capacitance measurement; Cutoff frequency; Diodes; Gallium arsenide; Image converters; Millimeter wave devices; Noise figure; Passivation; Submillimeter wave circuits; Submillimeter wave technology;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1979.19593
Filename :
1480171
Link To Document :
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