DocumentCode :
1064868
Title :
The importance of surface recombination and energy-bandgap arrowing in p-n-junction silicon solar cells
Author :
Fossum, Jerry G. ; Lindholm, Fredrik A. ; Shibib, Ayman M.
Author_Institution :
University of Florida, Gainesville, FL
Volume :
26
Issue :
9
fYear :
1979
fDate :
9/1/1979 12:00:00 AM
Firstpage :
1294
Lastpage :
1298
Abstract :
Experimental data demonstrating the sensitivity of open-circuit voltage to front-surface conditions are presented for a variety of p-n-junction silicon solar cells. Analytical models accounting for the data are defined and supported by additional experiments. The models and the data imply that a) surface recombination significantly limits the open-circuit voltage (and the short-circuit current) of typical silicon cells, and b) energy-bandgap narrowing is important in the manifestation of these limitations. The models suggest modifications in both the structural design and the fabrication processing of the cells that would result in substantial improvements in cell performance. The benefits of one such modification-the addition of a thin thermal silicon-dioxide layer on the front surface-are indicated experimentally.
Keywords :
Analytical models; Circuits; Current density; Fabrication; Helium; Impurities; NASA; Photovoltaic cells; Silicon; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1979.19596
Filename :
1480174
Link To Document :
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