DocumentCode
1064868
Title
The importance of surface recombination and energy-bandgap arrowing in p-n-junction silicon solar cells
Author
Fossum, Jerry G. ; Lindholm, Fredrik A. ; Shibib, Ayman M.
Author_Institution
University of Florida, Gainesville, FL
Volume
26
Issue
9
fYear
1979
fDate
9/1/1979 12:00:00 AM
Firstpage
1294
Lastpage
1298
Abstract
Experimental data demonstrating the sensitivity of open-circuit voltage to front-surface conditions are presented for a variety of p-n-junction silicon solar cells. Analytical models accounting for the data are defined and supported by additional experiments. The models and the data imply that a) surface recombination significantly limits the open-circuit voltage (and the short-circuit current) of typical silicon cells, and b) energy-bandgap narrowing is important in the manifestation of these limitations. The models suggest modifications in both the structural design and the fabrication processing of the cells that would result in substantial improvements in cell performance. The benefits of one such modification-the addition of a thin thermal silicon-dioxide layer on the front surface-are indicated experimentally.
Keywords
Analytical models; Circuits; Current density; Fabrication; Helium; Impurities; NASA; Photovoltaic cells; Silicon; Voltage;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1979.19596
Filename
1480174
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