• DocumentCode
    1065112
  • Title

    Stray field interaction in PtCo/SiO2/NiFe multilayer thin film structures

  • Author

    Hill, E.V. ; McCullough, A.M.

  • Author_Institution
    Dept. of Electr. Eng., Manchester Univ., UK
  • Volume
    24
  • Issue
    2
  • fYear
    1988
  • fDate
    3/1/1988 12:00:00 AM
  • Firstpage
    1707
  • Lastpage
    1709
  • Abstract
    Integral high coercivity sputtered PtCo thin magnetic films are used to bias magnetoresistive sensors. The devices utilize a three-layer structure of NiFe and PtCo thin films separated by an SiO2 spacer layer. The hard- and easy-axis coercivities of the NiFe layer are shown to be strongly dependent on the spacer thickness for values of thickness below about 200 nm. The stray field interaction between the layers is modeled by representing magnetic inhomogeneities in the PtCo layer as a rectangular array of regions with randomly aligned but uniform magnetization. Scaling adjustments to only two parameters, the magnitude of the magnetization inhomogeneity and the boundary spacing, gives a good fit to the experimental results.
  • Keywords
    cobalt alloys; coercive force; iron alloys; magnetic thin films; magnetisation; metal-insulator-metal structures; nickel alloys; platinum alloys; silicon compounds; sputtered coatings; PtCo-SiO2-NiFe; high coercivity sputtered PtCo thin magnetic films; magnetic inhomogeneities; magnetoresistive sensors; multilayer thin film structures; spacer layer; stray field interaction; Coercive force; Magnetic films; Magnetic hysteresis; Magnetic materials; Magnetic separation; Magnetostriction; Nonhomogeneous media; Permanent magnets; Saturation magnetization; Transistors;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.11577
  • Filename
    11577