DocumentCode :
1065186
Title :
Low-power high-performance nand match line content addressable memories
Author :
Chaudhary, Vikas ; Clark, Lawrence T.
Author_Institution :
Dept. of Electr. Eng., Arizona State Univ., Tempe, AZ
Volume :
14
Issue :
8
fYear :
2006
Firstpage :
895
Lastpage :
905
Abstract :
Content addressable memory (CAM) is used in fully associative VLSI lookup circuits for cache memory, translation lookaside buffers (TLBs), and in Internet Protocol (IP) address comparison. In this paper, the use of dynamic nand match lines is investigated and compared to conventional nor match lines in cache applications. To achieve high speed, a hierarchical match line is used. The dynamic stack charge-sharing noise immunity, speed, and actual power savings over a conventional nor match line are investigated using benchmark data. While random patterns are often used when benchmarking CAM match line power, it is shown to be optimistic compared to address trace data, since addresses are highly correlated. It is also shown that proper address input ordering can provide additional power savings. A simple model for the power in dynamic circuit stacks is derived and compared to power simulation data. Additionally, impact on cache tag area and the scaling of the nand stack to future processes is described
Keywords :
VLSI; cache storage; content-addressable storage; logic design; logic gates; low-power electronics; table lookup; Internet protocol address comparison; NOR match lines; cache memory; cache tag; content addressable memories; domino power; dynamic NAND match lines; dynamic circuit stacks; dynamic stack charge-sharing noise immunity; fully associative VLSI lookup circuits; hierarchical match line; proper address input ordering; translation lookaside buffers; Associative memory; Buffer storage; CADCAM; Cache memory; Circuit simulation; Computer aided manufacturing; Electronics industry; Pattern matching; Protocols; Very large scale integration; Cache tag; content addressable memory (CAM); domino power; nand match line;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/TVLSI.2006.878476
Filename :
1664909
Link To Document :
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