DocumentCode :
1065207
Title :
SubIslands: the probabilistic match assignment algorithm for subcircuit recognition
Author :
Rubanov, Nikolay
Author_Institution :
Circuit Semantics Inc., San Jose, CA, USA
Volume :
22
Issue :
1
fYear :
2003
fDate :
1/1/2003 12:00:00 AM
Firstpage :
26
Lastpage :
38
Abstract :
The recognition of subcircuit instances in a larger circuit is widely used in the simulation, verification, and testing of integrated circuit computer-aided designs. Subcircuit recognition (SR) can be stated as a problem of finding images of a small model bipartite graph (BG) corresponding to a subcircuit in a large object BG corresponding to a circuit. The best-known SR algorithms are based on the search-oriented subgraph isomorphism methods. Unfortunately, these methods may require a long runtime for large and highly symmetrical circuits. The authors develop a new high-performance probabilistic recognition method for solving the SR problem. This method combines: 1) the graduated assignment matching technique; 2) two well-known concepts from pattern recognition theory, namely, the error propagation and the delayed decision making; and 3) an efficient probabilistic BG labeling algorithm. In contrast to the search-based algorithms, the new recognition method solves the SR problem as an optimization task and, as a consequence, allows extremely fast simultaneous finding of subcircuit images. The experimental results show that this approach recognizes all the subcircuit instances orders of magnitude faster than the search-oriented algorithms.
Keywords :
VLSI; circuit CAD; circuit optimisation; circuit simulation; decision making; graph theory; integrated circuit design; pattern recognition; IC computer-aided designs; SubIslands; VLSI design; delayed decision making; error propagation; graduated assignment matching technique; graph labeling; integrated circuit designs; large object bipartite graph; model bipartite graph; optimization method; pattern recognition theory; probabilistic match assignment algorithm; probabilistic recognition method; subcircuit recognition; Bipartite graph; Circuit simulation; Circuit testing; Computational modeling; Computer simulation; Design automation; Image recognition; Integrated circuit testing; Runtime; Strontium;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/TCAD.2002.805722
Filename :
1158251
Link To Document :
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