DocumentCode
1065279
Title
Timing constraints for domino logic gates with timing-dependent keepers
Author
Jung, Seong-Ook ; Kim, Ki-Wook ; Kang, Sung-Mo
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Illinois, Urbana, IL, USA
Volume
22
Issue
1
fYear
2003
fDate
1/1/2003 12:00:00 AM
Firstpage
96
Lastpage
103
Abstract
Low threshold voltage (Vt) can be applied to domino logic to improve the performance in dual threshold voltage technology. Then, the keeper transistor should be up-sized to compensate for reduced noise margin due to the significant subthreshold current of low Vt transistor. However, a large keeper transistor degrades performance. To resolve the tradeoff between performance and noise margin, the authors propose a new domino logic which incorporates a dual keeper structure and delay logic gates. Detailed timing analysis of the proposed domino logic yields optimal timing conditions wherein a contention-free skew-tolerant window is maximized. A broad range of the skew-tolerant window connotes robustness against noise and design parameter variations, while reduced contention between keeper and evaluation NMOS transistors ensures high-speed switching. The authors show that the dual keeper structure increases noise tolerance and delay logic gates fortify signal skew tolerance. Simulation results verify that the proposed domino logic is robust to noise and signal skew while presenting high performance and power efficiency.
Keywords
circuit optimisation; integrated circuit design; integrated circuit noise; integrated logic circuits; logic design; logic gates; timing; tolerance analysis; circuit optimization; contention-free skew-tolerant window; delay logic gates; design parameter variations; domino logic; dual keeper structure; dual threshold voltage technology; evaluation NMOS transistors; high-speed switching; noise margin; noise robustness; noise tolerance improvement; optimal timing conditions; signal skew robustness; subthreshold current; timing analysis; tolerance analysis; Clocks; Degradation; Delay; Integrated circuit noise; Logic gates; Noise reduction; Noise robustness; Subthreshold current; Threshold voltage; Timing;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/TCAD.2002.805724
Filename
1158257
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