DocumentCode :
1065349
Title :
CMOS compatible high-voltage compliant MESFET-based analogue IC building blocks
Author :
Kim, S. ; Lepkowski, W. ; Thornton, T.J. ; Bakkaloglu, B.
Author_Institution :
Dept. of Electr. Eng., Arizona State Univ., Tempe, AZ
Volume :
45
Issue :
12
fYear :
2009
Firstpage :
624
Lastpage :
626
Abstract :
MESFET devices provide high breakdown characteristics, enable high-voltage operation, and direct battery hook-up with no changes in processing on state-of-the-art SOI and SOS CMOS processes. Fundamental analogue building blocks, including single-ended amplifiers and high impedance current mirrors were designed and fabricated in a single poly, three-layer metal digital CMOS technology utilising depletion mode MESFET devices. The SOS MESFETS presented here have a breakdown voltage of over 7.5 V without causing irreversible damage. DC characteristics were measured by varying the power supply from 2.5 to 5.5 V. The measured DC transfer curves of the amplifier show good agreement with the simulated ones with extracted models from the same process. The accuracy of the current mirror showing inverse operation is within 5 for the current from 0 to 1.5 mA with the power supply from 2.5 to 5.5 V.
Keywords :
CMOS integrated circuits; MESFET integrated circuits; analogue integrated circuits; digital integrated circuits; CMOS compatible high-voltage compliant; MESFET-based analogue IC building blocks; SOI CMOS process; SOS CMOS process; current 0 mA to 1.5 mA; depletion mode MESFET devices; direct battery hook-up; fundamental analogue building blocks; high impedance current mirrors; high-voltage operation; single poly metal digital CMOS technology; single-ended amplifiers; three-layer metal digital CMOS technology; voltage 2.5 V to 5.5 V;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el.2009.1130
Filename :
5069776
Link To Document :
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