DocumentCode
1065387
Title
Novel Local Silicon-Gate Carbon Nanotube Transistors Combining Silicon-on-Insulator Technology for Integration
Author
Zhang, Min ; Chan, Philip C.H. ; Chai, Yang ; Liang, Qi ; Tang, Z.K.
Author_Institution
Dept. of Electron. & Comput. Eng., Hong Kong Univ. of Sci. & Technol., Kowloon
Volume
8
Issue
2
fYear
2009
fDate
3/1/2009 12:00:00 AM
Firstpage
260
Lastpage
268
Abstract
By taking advantage of the silicon-on-insulator technology and the in situ carbon nanotube (CNT) growth, new local silicon-gate carbon nanotube FETs (CNFETs) have been implemented in this paper. We propose an approach to integrate the CNFET onto the silicon CMOS platform for the first time. Individual device operation, batch fabrication, low parasitic capacitance, and better compatibility to the CMOS process were realized. The characteristics of the CNFETs are comparable to the state-of-the-art devices reported. The scaling effect, ambipolar conductance, Schottky barrier effect, and I-V characteristics noise were analyzed. The physical properties of the CNTs were also characterized.
Keywords
CMOS integrated circuits; Schottky barriers; carbon nanotubes; field effect transistors; silicon-on-insulator; CMOS platform; CNFET; Schottky barrier; Si-C; ambipolar conductance; scaling effect; silicon-gate carbon nanotube FET; silicon-on-insulator technology; Carbon nanotube (CNT); carbon nanotube FET (CNFET); integration; nanotechnology; silicon-on-insulator (SOI);
fLanguage
English
Journal_Title
Nanotechnology, IEEE Transactions on
Publisher
ieee
ISSN
1536-125X
Type
jour
DOI
10.1109/TNANO.2008.2011773
Filename
4749330
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