• DocumentCode
    1065387
  • Title

    Novel Local Silicon-Gate Carbon Nanotube Transistors Combining Silicon-on-Insulator Technology for Integration

  • Author

    Zhang, Min ; Chan, Philip C.H. ; Chai, Yang ; Liang, Qi ; Tang, Z.K.

  • Author_Institution
    Dept. of Electron. & Comput. Eng., Hong Kong Univ. of Sci. & Technol., Kowloon
  • Volume
    8
  • Issue
    2
  • fYear
    2009
  • fDate
    3/1/2009 12:00:00 AM
  • Firstpage
    260
  • Lastpage
    268
  • Abstract
    By taking advantage of the silicon-on-insulator technology and the in situ carbon nanotube (CNT) growth, new local silicon-gate carbon nanotube FETs (CNFETs) have been implemented in this paper. We propose an approach to integrate the CNFET onto the silicon CMOS platform for the first time. Individual device operation, batch fabrication, low parasitic capacitance, and better compatibility to the CMOS process were realized. The characteristics of the CNFETs are comparable to the state-of-the-art devices reported. The scaling effect, ambipolar conductance, Schottky barrier effect, and I-V characteristics noise were analyzed. The physical properties of the CNTs were also characterized.
  • Keywords
    CMOS integrated circuits; Schottky barriers; carbon nanotubes; field effect transistors; silicon-on-insulator; CMOS platform; CNFET; Schottky barrier; Si-C; ambipolar conductance; scaling effect; silicon-gate carbon nanotube FET; silicon-on-insulator technology; Carbon nanotube (CNT); carbon nanotube FET (CNFET); integration; nanotechnology; silicon-on-insulator (SOI);
  • fLanguage
    English
  • Journal_Title
    Nanotechnology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1536-125X
  • Type

    jour

  • DOI
    10.1109/TNANO.2008.2011773
  • Filename
    4749330