• DocumentCode
    1065394
  • Title

    Fabrication and Electrical Characterization of Densified Carbon Nanotube Micropillars for IC Interconnection

  • Author

    Liu, Zhengchun ; Ci, Lijie ; Kar, Swastik ; Ajayan, Pulickel M. ; Lu, Jian-Qiang

  • Author_Institution
    Center for Integrated Electron., Rensselaer Polytech. Inst., Troy, NY
  • Volume
    8
  • Issue
    2
  • fYear
    2009
  • fDate
    3/1/2009 12:00:00 AM
  • Firstpage
    196
  • Lastpage
    203
  • Abstract
    Closely packed carbon nanotube (CNT) bundles are expected to have higher conductivity than copper and could potentially replace copper for electrical and thermal conductors in IC chips. However, it is extremely difficult, if not impossible, to controllably grow closely packed CNT bundles. We report on a novel postgrowth capillary densification method, which results in dramatic increase of CNT site density. Bare CNT pillars are densified approximately 15 times. High-density CNT micropillars and micrologs with round cross sections were fabricated from CNTs coated with parylene prior to densification. These CNT micropillars and micrologs could be used as basic building blocks for future IC interconnection. Electrical characterization results show that the densification process does not mitigate the electrical conducting performance of CNTs.
  • Keywords
    carbon nanotubes; conductors (electric); densification; electrical conductivity; integrated circuit interconnections; C; CNT bundles; IC chips; IC interconnection; copper; densified carbon nanotube micropillar fabrication; electrical conductivity; electrical conductors; postgrowth capillary densification method; thermal conductors; Carbon nanotube (CNT); IC interconnection; densification; resistance;
  • fLanguage
    English
  • Journal_Title
    Nanotechnology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1536-125X
  • Type

    jour

  • DOI
    10.1109/TNANO.2008.2011774
  • Filename
    4749331