DocumentCode :
1065808
Title :
An Optimum Design Methodology for Planar-Type Coaxial Probes Applicable to Broad Temperature Permittivity Measurements
Author :
Kim, Namgon ; Yoon, Jeonghoon ; Cho, Sungjoon ; Cho, Jeiwon ; Cheon, Changyul ; Kwon, Youngwoo
Author_Institution :
Seoul Nat. Univ., Seoul
Volume :
56
Issue :
3
fYear :
2008
fDate :
3/1/2008 12:00:00 AM
Firstpage :
684
Lastpage :
692
Abstract :
A planar-type coaxial probe applicable to wide temperature and frequency range has been developed. The probe employs a dielectric with a low coefficient of thermal expansion to minimize the effect of thermal deformation for broad temperature measurements. Additionally, a detailed design methodology has been developed to optimize the probe apertures in an effort to minimize the measurement uncertainty while maximizing the operating bandwidth. For this purpose, thorough sensitivity analysis has been employed to correlate the probe structures and dimensions to the individual sensitivity parameters. The analysis has been validated by parametric experiments. By using the dielectric with a low coefficient of thermal expansion and optimizing the probe dimensions, accurate permittivity measurements have been demonstrated from 30 C to 75 C with 40-GHz bandwidth. With the application of the error-correction method, the measurement temperature range has been further extended all the way up to the boiling temperature of water C). Furthermore, the complex permittivities of methanol have been measured from 30 C to 50 C and the dispersion parameters and full interpolation formulas have been extracted.
Keywords :
error correction; measurement uncertainty; permittivity measurement; thermal expansion; thermal variables measurement; bandwidth 40 GHz; coefficient of thermal expansion; error correction method; measurement uncertainty; optimum design methodology; planar type coaxial probes; sensitivity analysis; temperature 30 degC to 75 degC; temperature measurements; temperature permittivity measurements; thermal deformation; Coaxial aperture; complex permittivity; planar-type probe; thermal deformation; wide temperature;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.2008.916986
Filename :
4449065
Link To Document :
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