• DocumentCode
    1065817
  • Title

    Design and cold testing of a compact TE01° to TE20 mode converter

  • Author

    Spassovsky, I. ; Gouveia, Emmanuel S. ; Tantawi, Sami G. ; Hogan, Bart P. ; Lawson, Wes ; Granatstein, Victor L.

  • Author_Institution
    Inst. for Res. in Electron. & Appl. Phys., Maryland Univ., College Park, MD, USA
  • Volume
    30
  • Issue
    3
  • fYear
    2002
  • fDate
    6/1/2002 12:00:00 AM
  • Firstpage
    787
  • Lastpage
    793
  • Abstract
    In this paper, we discuss a new compact converter, which converts the TE01 circular mode into the TE20 rectangular mode. Compared to the Marie converter, the new device has a significantly shorter length and is, therefore, more suitable for use in evacuated waveguide systems. Both the design efforts and the experimental testing of the prototype are described. Based on computer simulations, this converter has a center frequency of 17.15 GHz, and the predicted power transfer between the desired modes is 99.9%. Results from the low-power testing of the prototype indicate that when the TE20 output mode is split into two equal parts (each in the TE10 rectangular mode), the power transferred to each arm of the split differs by less than 0.15 dB over a 200-MHz bandwidth. This is the first experimental study of a converter based on this design. A high-power version of this device is now being fabricated for use under high vacuum conditions.
  • Keywords
    convertors; microwave devices; waveguide components; 17.15 GHz; 200 MHz; TE01 circular mode; TE20 rectangular mode; center frequency; compact TE°01 to TE20 mode converter; evacuated waveguide systems; fabrication; gyroklystron; high vacuum conditions; high-power device; linear accelerator; low-power testing; output mode splitting; power transfer; Circuit testing; Electron beams; Joining processes; Klystrons; Linear accelerators; Physics; Power amplifiers; Prototypes; Tellurium; Vacuum breakdown;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2002.801498
  • Filename
    1158305