Title :
MP-A2 fast enhancement-mode GaAs MESFET logic
Author :
Krumm, C.F. ; Pierson, R.L.
fDate :
11/1/1979 12:00:00 AM
Keywords :
Chemicals; Circuit testing; Delay; Etching; Fabrication; Gallium arsenide; Large scale integration; Logic circuits; MESFETs; Ring oscillators;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1979.19697
