Title :
MP-A3 GaAs digital IC technology/Statistical analysis of device performance
Author :
Zucca, R. ; Welch, B.M. ; Eden, R.C. ; Long, S.I.
fDate :
11/1/1979 12:00:00 AM
Keywords :
Circuit testing; Digital integrated circuits; Fabrication; Gallium arsenide; Integrated circuit technology; Large scale integration; Logic devices; Logic gates; Schottky diodes; Statistical analysis;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1979.19698
