• DocumentCode
    1065954
  • Title

    Derivative measurements of the current-voltage characteristics of double-heterostructure injection lasers

  • Author

    Barnes, Peter A. ; Paoli, Thomas L.

  • Author_Institution
    Bell Laboratories, Murray Hill, NJ
  • Volume
    12
  • Issue
    10
  • fYear
    1976
  • fDate
    10/1/1976 12:00:00 AM
  • Firstpage
    633
  • Lastpage
    639
  • Abstract
    Measurements of the electrical characteristics of double-heterostructure (DH) stripe-geometry AlGaAs junction lasers are reported. We show that the electrical characteristics of these lasers are adequately represented by a resistor in series with a p-n junction characterized by a classical diode equation, I = I_{s} [\\hbox{exp } (q V_{j}/\\eta kT) - 1] . Devices have been measured with almost ideal junction characteristics with both the saturation current, Is, and the exponential parameter, η, constant, while in other diodes both η and Isexhibit a strong current dependence. Measurement of the first derivative dV/dI and the product IdV/dI is shown to be an especially useful technique for electrical characterization, yielding accurate and direct determination of the series resistance, the exponential junction parameter, and the laser threshold current. The observation of lasing threshold from an electrical measurement, instead of from the more usual optical measurement, is discussed in terms of the saturation behavior of the junction voltage at and above threshold.
  • Keywords
    Current measurement; Current-voltage characteristics; DH-HEMTs; Diodes; Electric variables; Electric variables measurement; Electrical resistance measurement; Equations; P-n junctions; Resistors;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/JQE.1976.1069050
  • Filename
    1069050