DocumentCode
1065954
Title
Derivative measurements of the current-voltage characteristics of double-heterostructure injection lasers
Author
Barnes, Peter A. ; Paoli, Thomas L.
Author_Institution
Bell Laboratories, Murray Hill, NJ
Volume
12
Issue
10
fYear
1976
fDate
10/1/1976 12:00:00 AM
Firstpage
633
Lastpage
639
Abstract
Measurements of the electrical characteristics of double-heterostructure (DH) stripe-geometry AlGaAs junction lasers are reported. We show that the electrical characteristics of these lasers are adequately represented by a resistor in series with a p-n junction characterized by a classical diode equation,
. Devices have been measured with almost ideal junction characteristics with both the saturation current, Is , and the exponential parameter, η, constant, while in other diodes both η and Is exhibit a strong current dependence. Measurement of the first derivative
and the product
is shown to be an especially useful technique for electrical characterization, yielding accurate and direct determination of the series resistance, the exponential junction parameter, and the laser threshold current. The observation of lasing threshold from an electrical measurement, instead of from the more usual optical measurement, is discussed in terms of the saturation behavior of the junction voltage at and above threshold.
. Devices have been measured with almost ideal junction characteristics with both the saturation current, I
and the product
is shown to be an especially useful technique for electrical characterization, yielding accurate and direct determination of the series resistance, the exponential junction parameter, and the laser threshold current. The observation of lasing threshold from an electrical measurement, instead of from the more usual optical measurement, is discussed in terms of the saturation behavior of the junction voltage at and above threshold.Keywords
Current measurement; Current-voltage characteristics; DH-HEMTs; Diodes; Electric variables; Electric variables measurement; Electrical resistance measurement; Equations; P-n junctions; Resistors;
fLanguage
English
Journal_Title
Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
0018-9197
Type
jour
DOI
10.1109/JQE.1976.1069050
Filename
1069050
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