DocumentCode :
1065954
Title :
Derivative measurements of the current-voltage characteristics of double-heterostructure injection lasers
Author :
Barnes, Peter A. ; Paoli, Thomas L.
Author_Institution :
Bell Laboratories, Murray Hill, NJ
Volume :
12
Issue :
10
fYear :
1976
fDate :
10/1/1976 12:00:00 AM
Firstpage :
633
Lastpage :
639
Abstract :
Measurements of the electrical characteristics of double-heterostructure (DH) stripe-geometry AlGaAs junction lasers are reported. We show that the electrical characteristics of these lasers are adequately represented by a resistor in series with a p-n junction characterized by a classical diode equation, I = I_{s} [\\hbox{exp } (q V_{j}/\\eta kT) - 1] . Devices have been measured with almost ideal junction characteristics with both the saturation current, Is, and the exponential parameter, η, constant, while in other diodes both η and Isexhibit a strong current dependence. Measurement of the first derivative dV/dI and the product IdV/dI is shown to be an especially useful technique for electrical characterization, yielding accurate and direct determination of the series resistance, the exponential junction parameter, and the laser threshold current. The observation of lasing threshold from an electrical measurement, instead of from the more usual optical measurement, is discussed in terms of the saturation behavior of the junction voltage at and above threshold.
Keywords :
Current measurement; Current-voltage characteristics; DH-HEMTs; Diodes; Electric variables; Electric variables measurement; Electrical resistance measurement; Equations; P-n junctions; Resistors;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/JQE.1976.1069050
Filename :
1069050
Link To Document :
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