Title :
Use of the Kompfner dip effect in multistage gyro-TWTs of high average power
Author :
Nusinovich, Gregory S. ; Walter, Mark T.
Author_Institution :
Inst. for Res. in Electron. & Appl. Phys., Maryland Univ., College Park, MD, USA
fDate :
6/1/2002 12:00:00 AM
Abstract :
Very often, in order to realize a high-gain operation of gyro-traveling-wave tubes (gyro-TWTs), the tubes are designed as multistage amplifiers, in which each section is short enough and thus, stable. In such tubes, the wave amplified in the input and intermediate stages should be absorbed at their ends by matching loads, which often limits the average power capability of these devices. This limitation can be avoided if these stages operate in the regime of the wave absorption by an electron beam. A long time ago, such a regime in conventional TWTs driven by linear electron beams was studied by Kompfner (1950), so the effect of wave attenuation in the gain curve is known as the Kompfner dip. In the present paper, we consider a two-stage (gyro-)TWT in which the first section operates in the Kompfner dip regime. The small-signal theory is developed, which allows one to analyze the tradeoffs in the small-signal gain and bandwidth associated with this kind of operation. The large-signal simulations indicate that such a two-stage gyro-TWT can operate with the orbital efficiency of 40% (total efficiency of 15%) and the gain over 40 dB.
Keywords :
cyclotron masers; gyrotrons; microwave power amplifiers; travelling wave amplifiers; Kompfner dip effect; cyclotron resonance masers; electron beam; gain curve; gyro-traveling-wave tubes; high average power; high-gain operation; large-signal simulations; linear electron beams; matching loads; multistage amplifiers; multistage gyro-TWT; multistage microwave amplifier; orbital efficiency; small-signal theory; wave absorption; Absorption; Attenuation; Coupling circuits; Electromagnetic coupling; Electromagnetic waveguides; Electron beams; Electronics packaging; Equations; Optical coupling; Space charge;
Journal_Title :
Plasma Science, IEEE Transactions on
DOI :
10.1109/TPS.2002.801565