Title :
Embedded high-precision capacitor measurement system based on ring-oscillator
Author :
Welter, L. ; Dreux, P. ; Aziza, H. ; Portal, J.-M.
Author_Institution :
IM2NP, Aix-Marseille Univ., Marseille, France
Abstract :
A direct way to measure the electrical value of capacitors embedded in a circuit using a ring-oscillator is presented. A calibration system ensures the robustness of the measurement process against temperature, power supply and process variations. Silicon results show the ability of the system to measure robustly a large range of small capacitors. The system also provides a noise immunity as the system provides a digital signature of the capacitor value.
Keywords :
capacitance measurement; capacitors; oscillators; calibration system; capacitor value; digital signature; electrical value measurement; embedded high-precision capacitor measurement system; measurement process robustness; noise immunity; power supply; process variations; ring-oscillator;
Journal_Title :
Electronics Letters
DOI :
10.1049/el.2014.4373