• DocumentCode
    106610
  • Title

    Embedded high-precision capacitor measurement system based on ring-oscillator

  • Author

    Welter, L. ; Dreux, P. ; Aziza, H. ; Portal, J.-M.

  • Author_Institution
    IM2NP, Aix-Marseille Univ., Marseille, France
  • Volume
    51
  • Issue
    6
  • fYear
    2015
  • fDate
    3 19 2015
  • Firstpage
    521
  • Lastpage
    523
  • Abstract
    A direct way to measure the electrical value of capacitors embedded in a circuit using a ring-oscillator is presented. A calibration system ensures the robustness of the measurement process against temperature, power supply and process variations. Silicon results show the ability of the system to measure robustly a large range of small capacitors. The system also provides a noise immunity as the system provides a digital signature of the capacitor value.
  • Keywords
    capacitance measurement; capacitors; oscillators; calibration system; capacitor value; digital signature; electrical value measurement; embedded high-precision capacitor measurement system; measurement process robustness; noise immunity; power supply; process variations; ring-oscillator;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el.2014.4373
  • Filename
    7062171