Title :
An Analog Circuit for Accurate OCVD Measurements
Author :
Bellone, Salvatore ; Licciardo, Gian Domenico
Author_Institution :
Dept. of Inf. & Electr. Eng., Univ. of Salerno, Salerno
fDate :
6/1/2008 12:00:00 AM
Abstract :
An electronic circuit for making accurate open-circuit voltage decay measurements is presented. The circuit overcomes the main limitations that occur in the standard method when used for carrier lifetime characterization because it realizes the ldquoopen-circuit conditionsrdquo of the device under test with an impedance higher than 100 MOmega and reduces the noise that is inherent in the differential operation of the method.
Keywords :
analogue circuits; carrier lifetime; semiconductor device measurement; voltage measurement; OCVD measurement; analog circuit; carrier lifetime characterization; device under test; open-circuit voltage decay measurements; Differentiator; lifetime; measurement setup; open-circuit voltage decay (OCVD); signal-to-noise ratio (SNR);
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2007.915468
