• DocumentCode
    1066442
  • Title

    Advancements in codes for computer aided design of depressed collectors and tracing of backscattered electrons II. Improvements in modeling of the physics of secondary electron emission and backscattering

  • Author

    Valfells, Ágúst ; Singh, Amarjit ; Kolander, Murray J. ; Granatstein, Victor L.

  • Author_Institution
    Inst. for Res. in Electron. & Appl. Phys., Maryland Univ., College Park, MD, USA
  • Volume
    30
  • Issue
    3
  • fYear
    2002
  • fDate
    6/1/2002 12:00:00 AM
  • Firstpage
    1271
  • Lastpage
    1276
  • Abstract
    The BSCAT computer code being developed by us for the design of depressed collectors for gyrotrons employs a special algorithm for tracing the trajectories of backscattered electrons. Monte Carlo techniques are used on a large ensemble of rays to ensure accurate representation of the stochastic process. Recent work has focused on improvement of the modeling of the electron backscatter phenomenon itself. We have introduced more accurate models for the backscatter coefficients for true secondaries, as well as elastically and inelastically backscattered primaries. These models are adapted to the energy ranges and the angles of incidence of the primaries. They are linked with experimental data as available in current literature or with Monte Carlo simulations. Analytical representations have been used where they closely approximate the experimental or simulation data, in an effort to make the computation as versatile and computationally inexpensive as feasible. The same has been done for angular and energy distributions of the emitted electrons.
  • Keywords
    CAD; Monte Carlo methods; electron backscattering; electronic engineering computing; gyrotrons; secondary electron emission; stochastic processes; BSCAT computer code; Monte Carlo simulations; Monte Carlo techniques; analytical representations; backscattered electrons; backscattered electrons tracing; computer aided design codes; depressed collectors; electron backscatter phenomenon; emitted electrons angular distributions; emitted electrons energy distributions; gyrotrons; modeling; secondary electron backscattering; secondary electron emission; stochastic process; Algorithm design and analysis; Analytical models; Backscatter; Computational modeling; Electron emission; Gyrotrons; Helium; Monte Carlo methods; Physics computing; Stochastic processes;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2002.801640
  • Filename
    1158365