DocumentCode
1066442
Title
Advancements in codes for computer aided design of depressed collectors and tracing of backscattered electrons II. Improvements in modeling of the physics of secondary electron emission and backscattering
Author
Valfells, Ágúst ; Singh, Amarjit ; Kolander, Murray J. ; Granatstein, Victor L.
Author_Institution
Inst. for Res. in Electron. & Appl. Phys., Maryland Univ., College Park, MD, USA
Volume
30
Issue
3
fYear
2002
fDate
6/1/2002 12:00:00 AM
Firstpage
1271
Lastpage
1276
Abstract
The BSCAT computer code being developed by us for the design of depressed collectors for gyrotrons employs a special algorithm for tracing the trajectories of backscattered electrons. Monte Carlo techniques are used on a large ensemble of rays to ensure accurate representation of the stochastic process. Recent work has focused on improvement of the modeling of the electron backscatter phenomenon itself. We have introduced more accurate models for the backscatter coefficients for true secondaries, as well as elastically and inelastically backscattered primaries. These models are adapted to the energy ranges and the angles of incidence of the primaries. They are linked with experimental data as available in current literature or with Monte Carlo simulations. Analytical representations have been used where they closely approximate the experimental or simulation data, in an effort to make the computation as versatile and computationally inexpensive as feasible. The same has been done for angular and energy distributions of the emitted electrons.
Keywords
CAD; Monte Carlo methods; electron backscattering; electronic engineering computing; gyrotrons; secondary electron emission; stochastic processes; BSCAT computer code; Monte Carlo simulations; Monte Carlo techniques; analytical representations; backscattered electrons; backscattered electrons tracing; computer aided design codes; depressed collectors; electron backscatter phenomenon; emitted electrons angular distributions; emitted electrons energy distributions; gyrotrons; modeling; secondary electron backscattering; secondary electron emission; stochastic process; Algorithm design and analysis; Analytical models; Backscatter; Computational modeling; Electron emission; Gyrotrons; Helium; Monte Carlo methods; Physics computing; Stochastic processes;
fLanguage
English
Journal_Title
Plasma Science, IEEE Transactions on
Publisher
ieee
ISSN
0093-3813
Type
jour
DOI
10.1109/TPS.2002.801640
Filename
1158365
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