Title :
Experimental Evaluation of Signal-to-Noise Ratio of Sigma-Delta Modulator for Superconducting Analog-to-Digital Converter
Author :
Furuta, Futoshi ; Saitoh, K. ; Yoshida, A. ; Suzuki, H.
Author_Institution :
Hitachi Ltd., Tokyo
fDate :
6/1/2007 12:00:00 AM
Abstract :
We designed a superconducting front-end circuit for an analog-to-digital converter and experimentally evaluated its signal-to-noise-ratio (SNR) at a sampling frequency of 10 GHz. The modulator was based on a first-order sigma-delta modulation with an LR integrator. Correct noise shaping was experimentally confirmed, and an SNR of 70.9 dB at a bandwidth of 10 MHz was achieved. In the circuit design, we investigated the effect of leakage in the LR integrator and thermal noise on the SNR by using transfer function analysis and circuit simulations with noise sources. Circuit parameters were designed to keep the discrepancy of the SNR from the ideal value (77.6 dB) within 6 dB. In the experimental evaluation, the modulated data signal from the superconducting chip was accumulated with room-temperature electronics. A fast Fourier transform (FFT) calculation was performed to obtain power spectra and SNRs. The power spectra and SNRs were consistent with the predictions of the transfer function analysis and circuit simulations.
Keywords :
circuit noise; sigma-delta modulation; superconducting device noise; superconducting devices; thermal noise; transfer functions; bandwidth 10 MHz; fast Fourier transform; frequency 10 GHz; noise figure 70.9 dB; noise figure 77.6 dB; noise shaping; sigma-delta modulator; signal-to-noise ratio; superconducting analog-to-digital converter; thermal noise; transfer function analysis; Analog-digital conversion; Circuit analysis; Circuit noise; Circuit simulation; Delta-sigma modulation; Noise shaping; Signal design; Signal to noise ratio; Superconducting device noise; Transfer functions; Analog-to-digital converter; leakage; sigma-delta modulation; single-flux quantum circuit; thermal noise;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2007.898239