DocumentCode

1066589

Title

WA-A8 A channel hot-electron degradation model for IGFET´s

Author

Troutman, R. ; Cottrell, P. ; Harroun, T. ; Chakravarti, S.

Volume

26

Issue

11

fYear

1979

fDate

11/1/1979 12:00:00 AM

Firstpage

1849

Lastpage

1850

Keywords

Circuits; Degradation; Electroluminescent devices; Electron emission; Electron traps; FETs; Temperature; Thin film devices; Voltage; Zinc compounds;

fLanguage

English

Journal_Title

Electron Devices, IEEE Transactions on

Publisher

ieee

ISSN

0018-9383

Type

jour

DOI

10.1109/T-ED.1979.19762

Filename

1480340