Title :
WA-A8 A channel hot-electron degradation model for IGFET´s
Author :
Troutman, R. ; Cottrell, P. ; Harroun, T. ; Chakravarti, S.
fDate :
11/1/1979 12:00:00 AM
Keywords :
Circuits; Degradation; Electroluminescent devices; Electron emission; Electron traps; FETs; Temperature; Thin film devices; Voltage; Zinc compounds;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1979.19762
