DocumentCode
1066602
Title
Distributed fiber-optic stress-location measurement by arbitrary shaping of optical coherence function
Author
He, Zuyuan ; Hotate, Kazuo
Author_Institution
Dept. of Frontier Informatics, Univ. of Tokyo, Japan
Volume
20
Issue
9
fYear
2002
fDate
9/1/2002 12:00:00 AM
Firstpage
1715
Lastpage
1723
Abstract
A functional distributed fiber-optic stress-location measurement technique by arbitrary shaping of the optical coherence function has been demonstrated. The technique measures the distribution or location of stress-induced polarization mode coupling in a polarization-maintaining fiber by manipulating the optical coherence function. The location of applied stress is given by optical path difference between the two polarization modes, which is determined by the synthesis of the coherence function. Three types of coherence function-a scanning peak, a scanning low-sidelobe peak, and a standing triangle-have been synthesized experimentally and used for stress locating. When using the coherence function of scanning peak, the coherence peak is slid to scan over the measurement range by a phase modulation to obtain the stress distribution; when using the triangular coherence function, the detection range is set within a linear slope of the triangle so that the stress location is directly converted into the value of the coherence degree.
Keywords
distributed sensors; fibre optic sensors; intelligent sensors; light coherence; optical fibre polarisation; stress measurement; applied stress; arbitrary shaping; distributed fiber-optic stress-location measurement; functional distributed fiber-optic stress-location measurement technique; optical coherence function; optical path difference; phase modulation; polarization modes; polarization-maintaining fiber; scanning low-sidelobe peak; scanning peak; smart materials; smart sensors; standing triangle; stress distribution; stress location; stress-induced polarization mode coupling; Coherence; Optical coupling; Optical fiber polarization; Optical fibers; Optical interferometry; Optical scattering; Optical sensors; Reflectometry; Stress measurement; Temperature sensors;
fLanguage
English
Journal_Title
Lightwave Technology, Journal of
Publisher
ieee
ISSN
0733-8724
Type
jour
DOI
10.1109/JLT.2002.802205
Filename
1158752
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