DocumentCode :
1066813
Title :
Design and application of an optimizing XROM silicon compiler
Author :
Linderman, Richard W. ; Rossbach, Paul C. ; Gallagher, David M.
Author_Institution :
Dept. of Electr. & Comput. Eng., Air Force Inst. of Technol., Wright-Patterson AFB, OH, USA
Volume :
8
Issue :
12
fYear :
1989
fDate :
12/1/1989 12:00:00 AM
Firstpage :
1267
Lastpage :
1275
Abstract :
It is demonstrated that optimization techniques incorporated within a silicon compiler for read-only memories (ROMs) can achieve significant yield, power, and speed improvements by minimizing the number of transistors, drains, and metal interconnections in the ROM. Transistor minimization adopts a heuristic solution to the NP-complete graph partitioning problem with a powerful technique applicable to various ROM design styles and technologies. If diffusion mask personalization is permitted, the design can be further improved by solving the traveling salesman problem to minimize transistor source/drain regions. In table look-up ROMs compiled for 3- and 1.2-μm CMOS with diffusion mask programming, the compiler eliminated over 45% of the transistors and drains. Test results show that 3-μm CMOS ROMs have access times between 50 and 70 ns. ROMs with 1.2-μm features achieve simulated access times below 20 ns. A simple interface allows the optimizing compiler to work easily with other CAD tools such as microcode assemblers
Keywords :
CMOS integrated circuits; circuit layout CAD; integrated memory circuits; optimisation; read-only storage; 1.2 micron; 3 micron; 50 to 70 ns; CAD; CAD tools; CMOS ROMs; NP-complete graph partitioning problem; ROM design styles; XROM silicon compiler; automatic layout; diffusion mask personalization; mask programming; memory circuit design; optimization techniques; read-only memories; table look-up ROMs; transistor minimisation; traveling salesman problem; CMOS technology; Chip scale packaging; Decoding; Design optimization; Helium; Optimizing compilers; Programmable logic arrays; Read only memory; Silicon compiler; Testing;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/43.44507
Filename :
44507
Link To Document :
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