DocumentCode :
1066878
Title :
Pressure sensitivity in anisotropically etched thin-diaphragm pressure sensors
Author :
Clark, Samuel K. ; Wise, K.D. ; Wise, Kensall D.
Author_Institution :
University of Michigan, Ann Arbor, MI
Volume :
26
Issue :
12
fYear :
1979
fDate :
12/1/1979 12:00:00 AM
Firstpage :
1887
Lastpage :
1896
Abstract :
In this paper the differential equations governing thin, square-diaphragm silicon pressure sensors are developed and solved using finite-difference numerical methods. Diaphragm deflection and stress patterns are presented in a normalized form applicable to diaphragms of arbitrary thickness and size. For 1-mm210-µm-thick diaphragms in
Keywords :
Anisotropic magnetoresistance; Costs; Etching; Industrial electronics; Medical services; Piezoresistance; Piezoresistive devices; Silicon; Stress; Transducers;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1979.19792
Filename :
1480370
Link To Document :
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