Title :
Full-CMOS 2-GHz WCDMA direct conversion transmitter and receiver
Author :
Lee, Kang-Yoon ; Lee, Seung-Wook ; Koo, Yido ; Huh, Hyoung-Ki ; Nam, Hee-Young ; Lee, Jeong-Woo ; Park, Joonbae ; Lee, Kyeongho ; Jeong, Deog-Kyoon ; Kim, Wonchan
Author_Institution :
Inter-Univ. Semicond. Res. Center, Seoul Nat. Univ., South Korea
fDate :
1/1/2003 12:00:00 AM
Abstract :
This paper presents a full-CMOS transmitter and receiver for 2.0-GHz wide-band code division multiple access with direct conversion mixers and a DC-offset cancellation scheme. The direct conversion scheme combined with a multiphase sampling fractional-N prescaler alleviates the problems of the direct conversion transmitter and receiver. Digital gain control is merged into the baseband filters and variable-gain amplifiers to optimize the linearity of the system, reduce the noise, and improve the sensitivity. Variable-gain amplifiers with DC-offset cancellation loop eliminate the DC-offset in each stage. The chip implemented in 0.35-μm CMOS technology shows the experimental results of 6 dBm maximum output power with 38-dB adjacent channel power rejection ratio at 1.92 MHz, 50-dB dynamic range, and 363-mW power consumption in the transmitter. The receiver shows -115.4 dBm sensitivity, a 4.0-dB noise figure, and a dynamic range of 80-dB with 396-mW power consumption.
Keywords :
CMOS integrated circuits; UHF integrated circuits; code division multiple access; gain control; mixed analogue-digital integrated circuits; radio receivers; radio transmitters; 0.35 micron; 2 GHz; 363 mW; 396 mW; 4 dB; CMOS technology; DC-offset cancellation scheme; WCDMA direct conversion receiver; WCDMA direct conversion transmitter; baseband filters; digital gain control; direct conversion mixers; multiphase sampling fractional-N prescaler; variable-gain amplifiers; wideband code division multiple access; Baseband; CMOS technology; Digital filters; Dynamic range; Energy consumption; Gain control; Multiaccess communication; Sampling methods; Transmitters; Wideband;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2002.806280