• DocumentCode
    1066993
  • Title

    Dynamic Idd test circuit for mixed signal ICs

  • Author

    Arguelles, J. ; Martinez, Manuel ; Bracho, S.

  • Author_Institution
    Dept. de Electron., Cantabria Univ., Santander
  • Volume
    30
  • Issue
    6
  • fYear
    1994
  • fDate
    3/17/1994 12:00:00 AM
  • Firstpage
    485
  • Lastpage
    486
  • Abstract
    Built-in test circuitry is proposed that uses the dynamic supply current consumption of a mixed signal circuit under test for a unified fault detection method. Simulation waveform are reported to illustrate the performance of the proposed circuitry
  • Keywords
    built-in self test; electric sensing devices; integrated circuit testing; mixed analogue-digital integrated circuits; IC testing; built-in test circuitry; dynamic Idd test circuit; dynamic supply current consumption; mixed signal ICs; unified fault detection method;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19940343
  • Filename
    280553
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1066993