Effect of Thermal Cycling on the Electrical Characteristics of HTS SQIFs and SQUIDs

Author

Ijsselsteijn, R.P.J. ; Schultze, V. ; Meyer, H.-G.

Author_Institution

Inst. for Phys. High Technol., Jena

Volume

17

Issue

2

fYear

2007

fDate

6/1/2007 12:00:00 AM

Firstpage

734

Lastpage

737

Abstract

In order to investigate the stability of HTS SQUIDs and SQIFs (arrays of SQUIDs with different loop size) based on YBCO bicrystal Josephson junctions we thermally cycled them in a controlled way 1000 times between 300 K and 77 K. The samples, which were partly covered with a Teflon protection layer, were electrically characterized after predetermined numbers of cycles. From these measurements the electrical parameters like critical current, normal resistance, maximum voltage modulation, width of the SQIF-peak and of the SQUID modulation, coupling inductance of the SQUID, and the maximum magnetic-field-to-voltage transfer factor were determined. Additionally, the critical current density of the YBCO-layers was determined.

Keywords

SQUIDs; critical current density (superconductivity); high-temperature superconductors; yttrium compounds; HTS SQIF; SQIF-peak; SQUID modulation; YBCO bicrystal Josephson junction; coupling inductance; critical current density; electrical characteristic; high temperature superconductor; magnetic-field-to-voltage transfer factor; maximum voltage modulation; normal resistance; thermal cycling; Current measurement; Electric variables; High temperature superconductors; Josephson junctions; Magnetic modulators; Protection; SQUIDs; Size control; Thermal stability; Yttrium barium copper oxide; High-temperature superconductors; SQUIDs; protective coatings; superconducting device reliability;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/TASC.2007.898723

Filename

4277458